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Advanced Characterization of Nanostructured Materials : Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons / Chetna Sharma.

By: Contributor(s): Material type: TextTextCopyright date: delhie : Discovery International, 2023Edition: First editionDescription: 400 pages ; illustrations : 26 cmContent type:
  • text
Media type:
  • unmediated
Carrier type:
  • volume
ISBN:
  • 9789385358500
Subject(s): DDC classification:
  • 23 620.1 S.C.A.
Summary: A comprehensive volume detailing advanced methods for characterizing nanostructured materials, with emphasis on synchrotron X-ray and neutron techniques—targeted at researchers and graduate-level students seeking methodological depth.
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Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
Books Books Media and mass communication Library AE3 620.1 S.C.A C.1 Available MA0003226
Total holds: 0

Includes bibliographical references and index.

Includes bibliographical references and index.

A comprehensive volume detailing advanced methods for characterizing nanostructured materials, with emphasis on synchrotron X-ray and neutron techniques—targeted at researchers and graduate-level students seeking methodological depth.

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